Atomic separation in Co/Cu/Co magnetic structures study by hybrid X-ray reflectivity – X-ray standing wave approach

نویسندگان

چکیده

The detailed characterization of nanometer-thin film structures is key to the in-depth understanding and property control such objects. Here we present analysis Co/Cu/Co multilayer grown on covered by thin Ta layers at individual layer thicknesses below 5 nm. prime focus was detect threshold Cu thickness required separate effectively magnetic Co layer. We found that a 4 nm can layers, but 2.8 not sufficient. To solve structural tasks, adapted hybrid X-ray reflectivity – standing wave free-form technique. applied study separation now it be used perform any task this kind also for other material combinations.

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ژورنال

عنوان ژورنال: Applied Surface Science

سال: 2022

ISSN: ['1873-5584', '0169-4332']

DOI: https://doi.org/10.1016/j.apsusc.2021.151573